X-ray Diffractometer - Rigaku SmartLAB
Microscale characterization
Rigaku SmartLAB X-ray Diffractometer (XRD)
Features:
- X-ray rotantig anode with 2 targets - Cu and Mo
- in-plane geometry with 5-axis goniometer
- high energy-resolution 2D detector
- wide temperature range: -180°C to 1500°C
- available for measurement of powder samples, capillaries, thin films, operando battery cells
Contact Person
Martin Kalbáč
Location
401