X-ray Diffractometer - Rigaku SmartLAB

Microscale characterization

Rigaku SmartLAB X-ray Diffractometer (XRD)

Features:

  • X-ray rotantig anode with 2 targets - Cu and Mo
  • in-plane geometry with 5-axis goniometer
  • high energy-resolution 2D detector
  • wide temperature range: -180°C to 1500°C
  • available for measurement of powder samples, capillaries, thin films, operando battery cells
Contact Person
Martin Kalbáč
Location
401