UHR-TEM - Ultra High Resolution Transmission Electron Microscope JEM-2100Plus

JEOL JEM-2100Plus 

• multi purpose transmission electron microscope for micro structure evaluation, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation
• maximum accelerating voltage - 200kV
• guaranteed resolution - 0.14 nm (TEM lattice image)
• magnification - x30 to x800 000