Microscopy methods
Special methods
Cryogenic confocal Raman microscope attoRAMAN
(attocube)
- ultra-high throughput spectrometer including a peltier-cooled - temperature 2 - 400 K
- magnetic fields of up to 15 T
- 532nm and 633 nm excitation wavelength
- back-illuminated CCD
Contact Person :Jana Vejpravová Kalbáčová
Location : C137, Cryogenics Laboratory „C“, Troja Campus of the Faculty of Mathematics and Physics
Integrated SPM with Raman spectrometer HR Evo Nano
(HORIBA)
- LabRAM HR Evolution (Horiba) - 800 focal length Raman spectrometer
- Available excitation wavelengths: 532 and 633 nm
- Coupling to Smart SPM (AIST-NT) for top and side optical access
- High frequency sample piezo scanning for enhanced stability
- Coupling to modular TRIOS/Combiscope SPM platform for top, bottom and side access
- XYZ objective piezo scanner for independent laser scanning
- Fully integrated software for controlling the whole AFM-Raman setup
Contact Person :Otakar Frank
Location : Basement, room 05, tel.: +420 266 052 012
Apparatus for complex study of thin films, interfaces and surface nanostructures
- ultrahigh vacuum apparatus for characterization of the studied samples by methods of X-ray photoelectron spectroscopy (XPS)
- ultraviolet photoelectron spectroscopy (UPS)
- low energy electron diffraction (LEED)
- scanning probe microscopy (SPM)
- low energy ion scattering spectroscopy (LEIS)
- angle resolved photoelectron spectroscopy (ARPES) with 3D spin detector.
Contact Person :Kalbáč Martin
Location : 2th floor, room 201
UHR TEM – Ultra High Reslution Transmission Electron Microscope JEM-2100Plus
JEOL
- multi purpose transmission electron microscope for micro structure evaluation, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation
- maximum accelerating voltage - 200kV
- guaranteed resolution - 0.14 nm (TEM lattice image)
- magnification - x30 to x800 000
Contact Person :Kalbáč Martin
Location :
Spectroscopic methods
Fluorescence spectrometer Fluorolog 3
HORIBA Jobin-Yvon
-
- excitation: Mercury lamp / KOHERAS Supercontinuum Laser
Contact Person :Kalbáč Martin
Location : Basement, room 08, tel.: +420 266 052 101
UV/Vis/NIR spectrometer Perkin-Elmer Lambda 1050
- 175 - 3300 nm wavelength range
- 3 detectors: Photomultiplier / Peltier-cooled InGaAs / Peltier-cooled PbS
- 60 mm spectralon integration sphere - 2 detectors (PMT / PbS)
- Spectroelectrochemical cuvette for the use both in trasnmission and reflectance
- Spectroelectrochemical cell for the use in transmission
- Electrochemical studies controlled by µAutolab (Ecochemie/Metrohm)
Contact Person :Otakar Frank
Location : 6th floor, room 608
Raman spectrometer LabRAM HR
(HORIBA Jobin-Yvon)
- 11 excitation wavelengths - Ar-Kr (Coherent Innova 70C Spectrum) : 457, 476, 488, 514, 531, 568, 647 nm - He-Ne (integrated): 633 nm - Diode: 785 nm - Diode: 830 nm - Nd-YAG: 1064 nm
- Olympus BX microscope, 50x and 100x vis LWD lenses, 50x IR LWD lens
- NEW! Piezo XYZ stage (PI 730.3CD)
- Manual / motorized XY stages, manual / piezo Z axis
- DuoScan
- Peltier-cooled CCD / liquid nitrogen cooled InGaAs detector for IR range
- Linkam heating stage (RT to 1500°C)
- Diamond-anvil cell
- Available gratings: 300, 600, 1200, 1800 l/mm
- Electrochemical cell(s) for in-situ spektroelectrochemical measurements; controlled by µAutolab (Ecochemie/Metrohm)
- Cantilever beam bending apparatus for in-situ spectromechanical studies
Contact Person :Kalbáč Martin
Location : Basement, room 08, tel.: +420 266 052 101
Raman spectrometer WITec alpha300 R
- 532 and 633 nm excitation wavelength
- Confocal microscope, 50x and 100x vis LWD lenses, 50x SWD lens
- Piezo XYZ stage (200x200x20 μm)
- Peltier-cooled EMCCD
- Available gratings: 600, 1200, 1800 l/mm
Contact Person :Kalbáč Martin
Location : Basement, room 08, tel.: +420 266 052 101
Structure characterization methods
TGA-MS Netzsch STA449 F1 Jupiter + Netzsch QMS 403 C Aelos
- Simultaneous thermal analysis (thermogravimetry + differential scanning calorimetry)
- analysis in Ar/O2/H2O mixtures or in vacuum
- mass detection of exhaust gases
- SiC oven from RT to 1550 °C
- Steel oven from -150 to 1000 °C
Contact Person :Martin Kalbáč
Location : 6th floor, room 610