Combined STM/nc-AFM - SPECS Aarhus 150

SPECS Scanning Probe Microscope Aarhus 150 

Features:

• Equipped with KolibriSensor for combined scanning tunneling microscopy (STM) and non-contact atomic force microscopy (nc-AFM)
• High mechanical stability for high-resolution scanning
• Operating temperature 90-400 K
• Scan range 1,500 nm x 1,500 nm
• Drift rate < 0.05 nm/min (vertical), < 0.15 nm/min (lateral)
• Integrated in the XPS/UPS UHV system for multiscale in-situ analysis