Schottky Field Emission Scanning Electron Microscope - Jeol JSM-IT800

Jeol JSM-IT800SHL Schottky Field Emission Scanning Electron Microscope (SEM) with Raman spectroscopy capabilities

Features:

• Schottky Field-Emission SEM
• Energy Dispersive X-ray Spectrometer (EDS)
• Secondary (SE) and back-scattered (BS) electrons detection
• Raman-SEM capabilities

Specs:

• Resolution: 0.5 nm (15 kV)
• Photo magnification: ×10 to ×2,000,000 (128 × 96 mm)
• Landing voltage: 0.01 to 30 kV
• Detector: Secondary electron detector (SED); Upper hybrid detector (UHD); Panchormatic PMT detector
• Electron gun: In-lens Schottky Plus field emission electron gun 
• Objective lens: Super hybrid lens - an electromagnetic/electrostatic field superposed objective lens
• Specimen stage: Full eucentric goniometer stage, tilt: -5 to 70°
• Stage control: 5-axis motor drive
• Low vacuum mode available.
• Analysis function:
  1. Energy Dispersive Spectroscopy (EDS)
  2. Cathodoluminescence (CL)
  3. Raman spectroscopy using Horiba iHR550, equipped with three gratings: 150 gr/mm (500 nm blaze), 600 gr/mm (500 nm blaze), 1800 gr/mm (450-850 nm blaze). 532 nm excitation is provided by the Oxxius L1C-532S laser. Peltier-cooled Syncerity CCD detector (E2V)